Integrated Reliability Test Systems (IRTS), Inc. is a provider of thermal shock test services and systems to the printed circuit board and electronic interconnect industries. Our products and services provide quantitative data on electrical interconnect reliability.
Highly Accelerated Thermal Shock (HATS) System
The HATS System is a patented, time-efficient, and cost-effective thermal shock reliability test method based on traditional air-to-air thermal cycling. The system uses a single chamber in which high volume hot and cold air alternately pass stationary samples, providing rapid thermal transfer and reducing the time for the samples to reach temperature equilibrium. The samples are fixtured to a high-speed precision resistance sampling network, allowing continuous monitoring of the samples during the temperature cycles.
HATS Test Services
Integrated Reliability Test Systems, Inc. offers test service through our service partners.
Technology Partners:
